Inspection assistance
Develop and evaluate defect classification or anomaly detection against your labeled inspection data.
02 /ChipSense / Semiconductor
Connect the defect to the context.
Bring inspection evidence, process history and engineering knowledge into one investigation. Specialist agents help engineers trace anomalies and decide what to examine next.
CHIPSENSE / WORKFLOW STUDYILLUSTRATIVE
BUILT AROUND YOUR ENVIRONMENT
- Inspection images
- MES / lot history
- FDC / metrology
A custom solution architecture, scoped and built for your organization.
01 /Inside the workflow
A clear path
through the complexity.
An inspection result rarely tells the whole story. The context sits in tool traces, lot history and engineering records.
Inspection to investigation
- THE INPUT
Wafer inspection results and lot identifiers.
- THE AGENT WORK
Group relevant patterns and retrieve matching process and tool context.
- THE USEFUL OUTPUT
A linked evidence package for the responsible engineer.
02 /What we can build
The right capabilities.
Working as one.
Combine a focused set of capabilities around the job. Start with a useful workflow, then expand as the evidence supports it.
Root-cause investigation
Connect inspection patterns to tool traces, lot history and process events for engineering review.
Engineering knowledge
Retrieve relevant procedures, prior investigations and design constraints with source references.
Yield analysis
Organize yield trends and candidate contributing factors into evidence-backed investigation plans.
03 /Ready for your reality
Trust is part
of the architecture.
Integration, privacy and evaluation are defined with the workflow. They shape what we build and how you decide it is ready.
Respect the boundary.
Process IP, recipes and inspection data stay within the agreed access and deployment boundaries. Recommendations do not bypass manufacturing change control.
Our approach to privacyKeep the decision clear.
Engineers validate candidate causes and approve any process or recipe change.
Measure what matters.
Agree a baseline using representative data. Evaluate the workflow before extending its scope.
- Defect-class performance
- False-positive rate
- Evidence coverage
- Investigation effort
FURTHER READING / BENCHMARK-BASED SCENARIO
Read the scenario Explore the ChipSense case file. It models a possible engagement using published benchmarks; it is not a client result.
04 /A useful first conversation
Let’s shape your
ChipSense workflow.
One workflow. The systems it touches. The outcome that matters. We’ll help turn that starting point into a clear scope.
Discuss your project CUSTOM SCOPE · QUOTATION ON REQUEST